This thesis use laser diode, lens, grating, and mirrors to composite the external cavity system to retrieve the thickness of the liquid crystal and its characteristics. This way is different to the traditional way of measure. It has good accuracy on the vertical resolution and the vertical resolution can reach to 0.3£gm. At the same time, it can develop the high quality of horizontal resolution.
On the basis of the correlation between the cavity length and the wavelength of the semiconductor laser, the system is capable of developing high horizontal resolution of accurate liquid crystal measurements. The horizontal resolution can reach to 40£gm. Furthermore, by adding bias on liquid crystal through this system, it expanded more understandings on the influences of bias and induced electric field of the electrodes to the tilting angle of the liquid crystal.
| Identifer | oai:union.ndltd.org:NSYSU/oai:NSYSU:etd-0811109-171108 |
| Date | 11 August 2009 |
| Creators | Lin, Chen-yi |
| Contributors | Tsung-hsien Lin, Chao-kuei Lee, Ann-kuo Chu, Yi-jen Chiu |
| Publisher | NSYSU |
| Source Sets | NSYSU Electronic Thesis and Dissertation Archive |
| Language | Cholon |
| Detected Language | English |
| Type | text |
| Format | application/pdf |
| Source | http://etd.lib.nsysu.edu.tw/ETD-db/ETD-search/view_etd?URN=etd-0811109-171108 |
| Rights | unrestricted, Copyright information available at source archive |
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