Analysis of Schottky diode failure mechanisms during exposure to an electron beam pulse using TCAD simulation

Description

Thesis (M.S. in Electrical Engineering)--Vanderbilt University, 2003. / Title from PDF title screen. Includes bibliographical references.

Links & Downloads

1. http://etd.library.vanderbilt.edu/ETD-db/available/etd-03272003-122718/

Tags

Diodes, Schottky-barrier

Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/53351802
Date	January 1900
Creators	Ralston-Good, Jeremy.
Source Sets	OCLC
Language	English
Detected Language	English