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Analysis of Schottky diode failure mechanisms during exposure to an electron beam pulse using TCAD simulation

Thesis (M.S. in Electrical Engineering)--Vanderbilt University, 2003. / Title from PDF title screen. Includes bibliographical references.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/53351802
Date January 1900
CreatorsRalston-Good, Jeremy.
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish

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