The purpose of this study is to develop accuracy enhancement techniques for the Time
Domain Reflection/Transmission (TDR/T) measurements including the analysis of the
error sources for the Enhanced Accuracy TDR/T (EA-TDR/T). These TDR/T techniques
are used for IC and IC package interconnect characterization and equivalent circuit model
extraction, which are important for evaluating the overall system performance in today's
digital IC design.
The frequency domain error correction has been used to get parameters for a
Device Under Test (DUT) from time domain measurements. The same technique can be
used as an intermediate step for obtaining the EA-TDR/T.
Careful choice of the acquisition window and precise alignment of the DUT and
calibration standard waveforms are necessary to get the accuracy enhancement for the
TDR/T. Improved FFT techniques are used in order to recover the actual spectra of the
step-like time domain waveforms acquired with an acquisition window with a finite time
length. The EA-TDR/T waveform are recovered from error corrected frequency domain
parameters of the DUT by launching an ideal excitation at the DUT and finding the response. The rise time of the ideal excitation can be faster than that of the physical excitation in the measurement system. However, excessive high-frequency noise can enter the system if the rise time of the ideal excitation is chosen to be too high.
The resulting EA-TDR/T waveforms show significantly less aberrations than the conventional TDR/T waveforms, hence allow us to extract accurate equivalent circuit model for the DUT, which in our case is IC interconnects. / Graduation date: 1995
| Identifer | oai:union.ndltd.org:ORGSU/oai:ir.library.oregonstate.edu:1957/35236 |
| Date | 30 September 1994 |
| Creators | Smolyansky, Dmitry A. |
| Contributors | Tripathi, Vijai K. |
| Source Sets | Oregon State University |
| Language | en_US |
| Detected Language | English |
| Type | Thesis/Dissertation |
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