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Comparison of image analysis systems for their ability to detect the white speck phenomenon

No description available.
Identiferoai:union.ndltd.org:GATECH/oai:smartech.gatech.edu:1853/8691
Date January 1996
CreatorsVon Hoven, Terri Michelle
PublisherGeorgia Institute of Technology
Source SetsGeorgia Tech Electronic Thesis and Dissertation Archive
Languageen_US
Detected LanguageEnglish
TypeThesis
Format240 bytes, text/html
RightsAccess restricted to authorized Georgia Tech users only.

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