This paper describes various approaches to hardware testing semiconductor memory. We describe the priciple of basic memory types, the way which each of them stores information and their comunication protocol. Following part deals with common failures which may occur in the memory. The section also describes the implementation of memory model and tester designed in VHDL language. It is possible to inject some errors into memory, which are later detected by the tester. The final section shows the response of tester to various error types according to used error detection method. The paper is especially focused on failure detection by variants of march test.
| Identifer | oai:union.ndltd.org:nusl.cz/oai:invenio.nusl.cz:236811 |
| Creators | Charvát, Jiří |
| Contributors | Straka, Martin, Strnadel, Josef |
| Publisher | Vysoké učení technické v Brně. Fakulta informačních technologií |
| Source Sets | Czech ETDs |
| Language | Czech |
| Detected Language | English |
| Type | info:eu-repo/semantics/masterThesis |
| Rights | info:eu-repo/semantics/restrictedAccess |
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