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Investigation of variables affecting focused ion beam milling as applied to specimen preparation for electron microscopy : a correlation between montecarlo based simulation and empirical observation

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1. https://stars.library.ucf.edu/rtd/2233

Identifer	oai:union.ndltd.org:ucf.edu/oai:stars.library.ucf.edu:rtd-3232
Date	01 January 1999
Creators	Prenitzer, Brenda I.
Publisher	STARS
Source Sets	University of Central Florida
Language	English
Detected Language	English
Type	text
Source	Retrospective Theses and Dissertations