A comparison of reliability prediction methodologies to observed field failure data : or four to doomsday /

Description

Thesis (M.S.)--Rochester Institute of Technology, 1991. / Typescript. Includes bibliographical references (leaves 40-41).

Links & Downloads

1. http://hdl.handle.net/1850/11235

Tags

Electronic circuits

Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/27109678
Date	January 1991
Creators	Butturini, Randal S.
Source Sets	OCLC
Language	English
Detected Language	English
Source	Online version of thesis