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Low temperature characterization of Si-bipolar junction transistors and Si←1←-←xGe←x heterojunction bipolar transistors

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Identiferoai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:241938
Date January 1997
CreatorsHashim, Md Roslan
PublisherUniversity of Southampton
Source SetsEthos UK
Detected LanguageEnglish
TypeElectronic Thesis or Dissertation

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