Flicker noise of scaled NMOS devices with high-K dielectrics and metal gate electrodes.

Description

Thesis (M.S.)--Lehigh University, 2009. / Adviser: Marvin H. White.

Links & Downloads

1. http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqdiss&rft_dat=xri:pqdiss:1463956

Tags

Engineering, Electronics and Electrical.

Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/472152993
Date	January 2009
Creators	Zhang, Xiaochen.
Source Sets	OCLC
Language	English
Detected Language	English