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Analysis and cost versus reliability in a multi-echelon supply chain for a chemical plant / Analysis and cost vs. reliability in a multi-echelon supply chain for a chemical plant

Thesis (M. Eng. in Logistics)--Massachusetts Institute of Technology, Engineering Systems Division, 2008. / Includes bibliographical references (leaves 62-63). / The object of the thesis is to develop a simple approach or heuristic for managing various types of uncertainty within a chemical production/inventory system. Later the company can use it to minimize the total cost at any required Cycle Service Level (CSL) under variable demand and production reliability. To solve this problem, we will base historical data to estimate the distribution type, the average demand and the standard deviation for the production line and initially assume that some factors like holding cost, penalty cost, demand and lead-time affect the production/inventory policy. Then, based on the above data and assumptions we build a model in Excel and then simulate some cases where change variables input. The model then is verified by Geert-Jan van Houtum Methodology. Finally, we will carry out the outcome analysis to capture the essence or insights of the multi-echelon problem. / by Nan Li & Guanghao Zhang. / M.Eng.in Logistics

Identiferoai:union.ndltd.org:MIT/oai:dspace.mit.edu:1721.1/45223
Date January 2008
CreatorsLi, Nan, M. Eng. Massachusetts Institute of Technology, Zhang, Guanghao
ContributorsChris Caplice., Massachusetts Institute of Technology. Engineering Systems Division., Massachusetts Institute of Technology. Engineering Systems Division.
PublisherMassachusetts Institute of Technology
Source SetsM.I.T. Theses and Dissertation
LanguageEnglish
Detected LanguageEnglish
TypeThesis
Format63 leaves, application/pdf
RightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission., http://dspace.mit.edu/handle/1721.1/7582

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