Hafnium dioxide gate dielectrics, metal gate electrodes, and phenomena occurring at their interfaces

Description

Thesis (Ph. D.)--University of Texas at Austin, 2004. / Supervisor: John G. Ekerdt. Vita. Includes bibliographical references. Also available from UMI.

Links & Downloads

1. http://repositories.lib.utexas.edu/bitstream/handle/2152/1258/schaefferj65282.pdf
2. http://wwwlib.umi.com/cr/utexas/fullcit?p3143465

Tags

Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/57663399
Date	January 2004
Creators	Schaeffer, James Kenyon, Ekerdt, John G.
Source Sets	OCLC
Language	English
Detected Language	English