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Premelting at the ice SiO 2 interface a high-energy x-ray microbeam diffraction study /

Zugl.: Stuttgart, Univ., Diss., 2005. / Druckausg. bei Books on Demand, Norderstedt erschienen.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/315580225
Date January 2005
CreatorsEngemann, Simon.
Publisher[S.l. : s.n.],
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
TypeOnline-Publikation.
SourceKostenfrei

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