A one-dimensional analytical model of dark current has been developed to facilitate the investigation and analysis of dark current from gate-controlled photovoltaic InSb arrays. The applied gate voltage is an essential parameter in the model. The expressions relating this parameter to surface potential are derived separately for the cases of accumulation and depletion at the surface of n-type InSb material under the gate. In addition, the measured dark current is compared with that from the analytical model, and the discrepancy is discussed in terms of the intrinsic carrier concentration, surface recombination velocity, and geometry of the array. The components of dark current are mainly associated with surface state generation-recombination, field induced tunneling, and the depletion region from the bulk and surface. The experimental results are obtained at temperatures between 30K and 40K.
| Identifer | oai:union.ndltd.org:arizona.edu/oai:arizona.openrepository.com:10150/276861 |
| Date | January 1988 |
| Creators | Chen, Hao, 1958- |
| Contributors | Schrimpf, R. D. |
| Publisher | The University of Arizona. |
| Source Sets | University of Arizona |
| Language | en_US |
| Detected Language | English |
| Type | text, Thesis-Reproduction (electronic) |
| Rights | Copyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author. |
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