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Development of improved methodology for characterization and simulation of electrostatic discharge (ESD) in mos devices and ICS

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1. https://stars.library.ucf.edu/rtd/1906

Identifer	oai:union.ndltd.org:ucf.edu/oai:stars.library.ucf.edu:rtd-2905
Date	01 July 2000
Creators	Lee, Jui Chu
Publisher	STARS
Source Sets	University of Central Florida
Language	English
Detected Language	English
Type	text
Source	Retrospective Theses and Dissertations