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The effects of noise on measurements made in a distributed parameter system.

Massachusetts Institute of Technology. Dept. of Electrical Engineering. Thesis. 1972. M.S. / MICROFICHE COPY ALSO AVAILABLE IN BARKER ENGINEERING LIBRARY. / Bibliography: leaf 47. / M.S.

Identiferoai:union.ndltd.org:MIT/oai:dspace.mit.edu:1721.1/101306
Date January 1972
CreatorsHersh, Rodney Robert
ContributorsLeonard A. Gould., Massachusetts Institute of Technology. Department of Electrical Engineering
PublisherMassachusetts Institute of Technology
Source SetsM.I.T. Theses and Dissertation
LanguageEnglish
Detected LanguageEnglish
TypeThesis
Format47 leaves, application/pdf
RightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission., http://dspace.mit.edu/handle/1721.1/7582

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