Thermal and electromigration induced strain and microstructure evolution in metal conductor lines.

Description

Thesis (Ph.D.)--Lehigh University, 2009. / Adviser: G. S. Cargill.

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1. http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqdiss&rft_dat=xri:pqdiss:3358117

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Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/591591895
Date	January 2009
Creators	Zhang, Hongqing.
Source Sets	OCLC
Language	English
Detected Language	English