As the great studies have been made in light emitting diodes, the application becomes more variety for different field. High bright light emitting diodes apply a new light source for fluorescence lifetime measurements. We use confocal scanning microscopy and a high frequency sensitive lock-in amplifier to obtain the electroluminescence image at ten of micrometer. We drive the light emitting diodes by radio frequency signal and observe it. We parallel connection an inductance to match the parasitic capacity in high frequency to obtain better light emitted brightness.
Identifer | oai:union.ndltd.org:NSYSU/oai:NSYSU:etd-0723107-232951 |
Date | 23 July 2007 |
Creators | Lin, Li-wei |
Contributors | Fu-ji Kao, Cheng-wen Ko, Wood-hi Cheng, Sheng-lung Huang |
Publisher | NSYSU |
Source Sets | NSYSU Electronic Thesis and Dissertation Archive |
Language | Cholon |
Detected Language | English |
Type | text |
Format | application/pdf |
Source | http://etd.lib.nsysu.edu.tw/ETD-db/ETD-search/view_etd?URN=etd-0723107-232951 |
Rights | not_available, Copyright information available at source archive |
Page generated in 0.002 seconds