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System and IC level analysis of electrostatic discharge (ESD) and electrical fast transient (EFT) immunity and associated coupling mechanisms

Thesis (Ph. D.)--Missouri University of Science and Technology, 2008. / Vita. The entire thesis text is included in file. Title from title screen of thesis/dissertation PDF file (viewed August 21, 2008) Includes bibliographical references.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/244252067
Date January 2008
CreatorsKoo, Ja Yong,
PublisherRolla, Mo. : Missouri University of Science and Technology,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
TypeElectronic books. Electronic dissertations.
SourceFreely available online

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