The extent of embedded systems' role in modern life has continuously increased over the years. Moreover, embedded systems are assuming highly critical functions with security requirements more than ever before. Electromagnetic fault injection (EMFI) is an efficient class of physical attacks that can compromise the immunity of secure cryptographic algorithms. Despite successful EMFI attacks, the effects of electromagnetic injection on a processor are not well understood. This includes lack of solid knowledge about how EMFI affects the circuit and deviates it from proper functionality. Also, effects of EM glitches on the global networks of a chip such as power, clock and reset network are not known. We believe to properly model EMFI and develop effective countermeasures, a deeper understanding of the EM effect on a chip is needed. In this thesis, we present a bottom-up analysis of EMFI effects on a RISC microprocessor. We study these effects at three levels: at the wire-level, at the chip-network level, and at the gate-level considering parameters such as EM-injection location and timing. We conclude that EMFI induces local timing errors implying current timing attack detection and prevention techniques can be adapted to overcome EMFI. To further validate our hypothesis, we integrate a configurable timing sensor into our microprocessor to evaluate its effectiveness against EMFI. / Master of Science / In the current technology era, embedded systems play a critical role in every human’s life. They are collecting very precise and private information of the users. So, they can become a potential target for the attackers to steal this valuable information. As a result, the security of these devices becomes a serious issue in this era.
Electromagnetic fault injection (EMFI) is an efficient class of physical attacks that can inject faults to the state of the processor and deviate it from its proper functionality. Despite its growing popularity among the attackers, limitations and capabilities of this attack are not very well understood. Several detection techniques have been proposed so far, but most of them are either very expensive to implement or not very effective. We believe to properly model EMFI and develop effective countermeasures, a deeper understanding of the EM effect on a chip is needed. In this research work, we try to perform a bottom-up analysis of EM fault injection on a RISC microprocessor and do a comprehensive study at all wire-level, chip-network level, and gate-level and finally propose a solution for it.
| Identifer | oai:union.ndltd.org:VTETD/oai:vtechworks.lib.vt.edu:10919/81906 |
| Date | 23 January 2018 |
| Creators | Ghodrati, Marjan |
| Contributors | Electrical and Computer Engineering, Nazhandali, Leyla, Abbott, A. Lynn, Schaumont, Patrick R. |
| Publisher | Virginia Tech |
| Source Sets | Virginia Tech Theses and Dissertation |
| Detected Language | English |
| Type | Thesis |
| Format | ETD, application/pdf |
| Rights | In Copyright, http://rightsstatements.org/vocab/InC/1.0/ |
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