This thesis presents an introduction to rough surface scattering and describes techniques that were used during the course of this project to measure and characterize electromagnetic scattering from a rough surface. An analytical model is described that accurately predicts the statistics of the measured scattering data. The CW measurement process that was used is described and scattering measurement results are presented. Calculated and measured statistical moments are compared in order to show agreement of measurements with various statistical scattering models. Recommendations for additional work in the area of measurement and analytical modeling of rough surface scattering are given.
| Identifer | oai:union.ndltd.org:ucf.edu/oai:stars.library.ucf.edu:rtd-5722 |
| Date | 01 January 1984 |
| Creators | Hargraves, Charles H. |
| Publisher | STARS |
| Source Sets | University of Central Florida |
| Language | English |
| Detected Language | English |
| Type | text |
| Format | application/pdf |
| Source | Retrospective Theses and Dissertations |
| Rights | Public Domain |
Page generated in 0.0062 seconds