This was a study to measure surface roughness using scattering of electromagnetic waves in the Ka and X microwave frequency bands. The detected fluctuations of the reflected field intensity is a measure of surface roughness. The reflected field intensity depends on the wavelength, the angle of incidence and the electrical properties of the media. Since the surface presents irregularities with randomly distributed facets, the characteristics of the rough-surface reflected wave can only be described by the statistical properties of the field intensity. The dependence of the normalized moments of the returned scatter on distance from the rough surface to the receiving antenna was analyzed as a function of surface roughness distribution at two different frequency-bands.
| Identifer | oai:union.ndltd.org:ucf.edu/oai:stars.library.ucf.edu:rtd-1504 |
| Date | 01 April 1980 |
| Creators | Nacouzi, Elie G. |
| Publisher | STARS |
| Source Sets | University of Central Florida |
| Language | English |
| Detected Language | English |
| Type | text |
| Format | application/pdf |
| Source | Retrospective Theses and Dissertations |
| Rights | Public Domain |
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