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Characterizations of interfacial damage of polymer encapsulated microelectronic devices /

Thesis (Ph. D.)--Lehigh University, 1998. / Includes vita. Includes bibliographical references (leaves 163-175).

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/40278570
Date January 1998
CreatorsPark, Jongwoo,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
TypeAcademic dissertations

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