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Conditional stuck-at fault model for PLA test generation

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Identiferoai:union.ndltd.org:LACETR/oai:collectionscanada.gc.ca:QMM.63959
Date January 1987
CreatorsCornelia, Olivian E.
PublisherMcGill University
Source SetsLibrary and Archives Canada ETDs Repository / Centre d'archives des thèses électroniques de Bibliothèque et Archives Canada
LanguageEnglish
Detected LanguageEnglish
TypeElectronic Thesis or Dissertation
Formatapplication/pdf
CoverageMaster of Engineering (Department of Electrical Engineering.)
RightsAll items in eScholarship@McGill are protected by copyright with all rights reserved unless otherwise indicated.
Relationalephsysno: 000665185, proquestno: AAIML46045, Theses scanned by UMI/ProQuest.

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