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Deep level traps and ionization coefficients of electronics and holes in InP

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1. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.253958

Identifer	oai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:253958
Date	January 1980
Creators	Choudhury, A. N. M.
Publisher	University of Sheffield
Source Sets	Ethos UK
Detected Language	English
Type	Electronic Thesis or Dissertation