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Angular Dependence of the Stopping Processes and the Yields of Ion-induced Electron Emission from Channeled MEV Protons in <100> Silicon Foils

The present work reports the experimental evidence of anomalous energy loss, energy straggling, and the corresponding ion-induced electron emission yields of channeled protons in silicon.

Identiferoai:union.ndltd.org:unt.edu/info:ark/67531/metadc279025
Date12 1900
CreatorsZhao, Zhiyong
ContributorsMcDaniel, Floyd Del. (Floyd Delbert), 1942-, Matteson, Samuel E., Anthony, John H., Duggan, Jerome L., Weathers, Duncan L., Kelber, Jeffry Alan, 1952-
PublisherUniversity of North Texas
Source SetsUniversity of North Texas
LanguageEnglish
Detected LanguageEnglish
TypeThesis or Dissertation
Formatxiii, 121 leaves : ill., Text
RightsPublic, Copyright, Copyright is held by the author, unless otherwise noted. All rights reserved., Zhao, Zhiyong

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