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Application of system identification (SI) to full-wave time domain characterization of microwave and millimeter wave passive structures

Mùˆnchen, Techn. University, Diss., 2004.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/76504052
Date January 2004
CreatorsCoccetti, Fabio.
Publisher[S.l. : s.n.],
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceLF

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