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Dynamische Spannungsmessungen an Submikrometerleitungen mittels der elektrischen Kraftmikroskopie - Dynamic voltage measurements on Submicrometer conducting lines by means of the electric force microscopy

The capability of todays electronics bases on the use of integrated circuits, which contain millions of electronic structures. The trend towards decreasing structure width and increasing working frequencies of the integrated circuits produces a demand for special test techniques for function and failure analysis of new developed integrated circuits. The electric force microscopy (EFM) is a promising new test technique for contact-less, chip-internal voltage measurements with simultaneous high temporal and high spatial resolution. In this thesis the behaviour of the EFM measurement signal is investigated regarding dynamic voltage measurements on parallel sub-micrometer conducting lines. Therefore, the influence of the structure width, the probe geometry and of cross-talk on the measurement signal is analysed by means of measurements, calculations and simulations. Furthermore, a broad overview about the properties and possibilities of different EFM-measurement set-ups is given and the suitability of the so called "heterodyne mixing technique" for the measurement of periodic digital voltage is investigated.

Identiferoai:union.ndltd.org:DUETT/oai:DUETT:duett-02012003-145358
Date03 February 2003
CreatorsBehnke, Ulf Erich
ContributorsProf. em. Dr.-Ing. E. Kubalek, Prof. Dr. rer. nat. F.J. Tegude
PublisherGerhard-Mercator-Universitaet Duisburg
Source SetsDissertations and other Documents of the Gerhard-Mercator-University Duisburg
LanguageGerman
Detected LanguageEnglish
Typetext
Formattext/html, application/pdf
Sourcehttp://www.ub.uni-duisburg.de/ETD-db/theses/available/duett-02012003-145358/
Rightsunrestricted, I hereby certify that, if appropriate, I have obtained and attached hereto a written permission statement from the owner(s) of each third party copyrighted matter to be included in my thesis, dissertation, or project report, allowing distribution as specified below. I certify that the version I submitted is the same as that approved by my advisory committee. Hiermit erteile ich der Universitaet Duisburg das nicht-ausschliessliche Recht unter den unten angegebenen Bedingungen, meine Dissertation, Staatsexamens- oder Diplomarbeit, meinen Forschungs- oder Projektbericht zu veroeffentlichen und zu archivieren. Ich behalte das Urheberrecht und das Recht das Dokument zu veroeffentlichen und in anderen Arbeiten weiterzuverwenden.

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