The main work of this paper is the description of electronic equipment that has been developed to measure the parameters of junction transistors over an appreciable frequency range and with changing bias points.
| Identifer | oai:union.ndltd.org:LACETR/oai:collectionscanada.gc.ca:QMM.109895 |
| Date | January 1955 |
| Creators | Borden, Byron C. |
| Contributors | (Supervisor) |
| Publisher | McGill University |
| Source Sets | Library and Archives Canada ETDs Repository / Centre d'archives des thèses électroniques de Bibliothèque et Archives Canada |
| Language | English |
| Detected Language | English |
| Type | Electronic Thesis or Dissertation |
| Format | application/pdf |
| Coverage | Master of Engineering. (Department of Engineering.) |
| Rights | All items in eScholarship@McGill are protected by copyright with all rights reserved unless otherwise indicated. |
| Relation | alephsysno: NNNNNNNNN, Theses scanned by McGill Library. |
Page generated in 0.002 seconds