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Radio frequency identification (RFID) applications in semiconductor manufacturing / Radio frequency identification applications in semiconductor manufacturing

Thesis (M. Eng. in Logistics)--Massachusetts Institute of Technology, Engineering Systems Division, 2004. / Includes bibliographical references (p. 87). / Radio frequency identification (RFID) has an enormous potential impact within the semiconductor supply chain, especially within semiconductor manufacturing. The end benefit of RFID will be in the mass serialization, and the subsequent tracking and tracing, of individual semiconductors, or what is referred to as Unit Level Traceability (ULT). Before all of the technical hurdles of ULT are overcome, however, there exists a host of other applications for RFID within semiconductor manufacturing. The identification of what can and what should be RFID-tagged and read, the analysis of how to collect this information and what to do with the data, and the implementation of some targeted opportunities will provides valuable information with regards to the technical and logistical hurdles of RFID within semiconductor manufacturing far before ULT becomes a reality. / by David Ian Cassett [and] Christopher William Chiu Hopeman. / M.Eng.in Logistics

Identiferoai:union.ndltd.org:MIT/oai:dspace.mit.edu:1721.1/28503
Date January 2004
CreatorsCassett, David Ian, 1971-, Hopeman, Christopher William Chiu, 1976-
ContributorsJames B. Rice, Jr., Massachusetts Institute of Technology. Engineering Systems Division., Massachusetts Institute of Technology. Engineering Systems Division.
PublisherMassachusetts Institute of Technology
Source SetsM.I.T. Theses and Dissertation
Languageen_US
Detected LanguageEnglish
TypeThesis
Format97 p., 5347915 bytes, 5358976 bytes, application/pdf, application/pdf, application/pdf
RightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission., http://dspace.mit.edu/handle/1721.1/7582

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