Return to search

Application of the maximum entropy method to x-ray profile analysis /

Thesis (Ph. D.)--University of Technology, Sydney, 1999.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/222800829
Date January 1999
CreatorsArmstrong, Nicholas.
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceElectronic version

Page generated in 0.0071 seconds