Current-controlled logic and single electron logic processors have been investigated with respect to thermal-induced bit error. A maximal error rate for both logic processors is regarded as one bit-error/year/chip. A maximal clock frequency and an information channel capacity at a given operation current are derived when a current-controlled logic processor works without error. An available operation range in a current-controlled processor with 100 million elements is discussed. The dependence of an error-free condition on temperature in single electron logic processors is derived. The size of the quantum dot of single electron transistor is predicted when a single electron logic processor with the a billion single electron transistors works without error at room temperature.
| Identifer | oai:union.ndltd.org:TEXASAandM/oai:repository.tamu.edu:1969.1/2224 |
| Date | 29 August 2005 |
| Creators | Kim, Jong Un |
| Contributors | Kish, Laszlo B., Sanchez-Sinencio, Edgar, Cheng, Mosong, Marlow, William |
| Publisher | Texas A&M University |
| Source Sets | Texas A and M University |
| Language | en_US |
| Detected Language | English |
| Type | Electronic Thesis, text |
| Format | 375771 bytes, electronic, application/pdf, born digital |
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