Return to search

Exchange bias effects of CrSe/Fe/GaAs thin film structure /

Thesis (Ph.D.)--Hong Kong University of Science and Technology, 2008. / Includes bibliographical references (leaves 89-92). Also available in electronic version.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/278497404
Date January 2008
CreatorsWang, Chao.
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceView abstract or full-text.

Page generated in 0.0015 seconds