Modeling and simulation of negative bias temperature instability degradation of field-effect transistors

Description

Zugl.: Wien, Techn. Univ., Diss., 2007 / Hergestellt on demand

Links & Downloads

1. http://d-nb.info/987736086/04

Tags

Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/506388908
Date	January 1900
Creators	Entner, Robert
Publisher	Saarbrücken VDM Verlag Dr. Müller
Source Sets	OCLC
Language	English
Detected Language	English