Return to search

AFM-FTIR: A New Technique for Materials Characterization

No description available.
Identiferoai:union.ndltd.org:OhioLink/oai:etd.ohiolink.edu:ucin1227192819
Date January 2008
CreatorsStarr, Michael J.
PublisherUniversity of Cincinnati / OhioLINK
Source SetsOhiolink ETDs
LanguageEnglish
Detected LanguageEnglish
Typetext
Sourcehttp://rave.ohiolink.edu/etdc/view?acc_num=ucin1227192819
Rightsunrestricted, This thesis or dissertation is protected by copyright: all rights reserved. It may not be copied or redistributed beyond the terms of applicable copyright laws.

Page generated in 0.0018 seconds