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A multi-regime model comparison for constant amplitude small crack behavior in Ti-6A1-4V

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Identiferoai:union.ndltd.org:GATECH/oai:smartech.gatech.edu:1853/16831
Date05 1900
CreatorsHamm, Richard William
PublisherGeorgia Institute of Technology
Source SetsGeorgia Tech Electronic Thesis and Dissertation Archive
Detected LanguageEnglish
TypeThesis
RightsAccess restricted to authorized Georgia Tech users only.

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