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Fault simulation for stuck-open faults in CMOS combinational circuits

Thesis (M.S.)--Ohio University, March, 1993. / Title from PDF t.p.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/230932813
Date January 1993
CreatorsSu, Lang.
PublisherOhio : Ohio University,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceConnect to resource online

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