Return to search

Optimized error coverage in built-in self-test by output data modification

No description available.
Identiferoai:union.ndltd.org:mcgill.ca/oai:escholarship.mcgill.ca:sn009z526
Date January 1987
CreatorsZorian, Yervant
PublisherMcGill University
Source SetsMcGill University
Languagehttp://id.loc.gov/vocabulary/iso639-2/eng
Detected LanguageEnglish
TypeThesis
RightsAll items in eScholarship@McGill are protected by copyright with all rights reserved unless otherwise indicated.
RelationPid: 75778, Proquest: AAINL46184

Page generated in 0.0017 seconds