No / The Internet of Things (IoT) has brought significant advancements in various domains, providing innovative and efficient solutions. However, ensuring the safe design and operation of IoT devices is
crucial, as the consequences of component failure can range from system
downtime to dangerous operating states. Several methods have been proposed to evaluate the failure behaviours of IoT-based systems, including
Fault Tree Analysis (FTA), a methodology adopted from other safetycritical domains. This study integrated FTA and Bayesian Network (BN)
models to assess IoT system reliability based on components’ reliability
data and other statistical information. The integrated model achieved
efficient predictive failure analysis, considering combinations of 12 basic
events to quantify the overall system’s reliability. The model also enables
criticality analysis, ranking basic events based on their contributions to
system failure and providing a guide for design modification in order to
enhance IoT safety. By comparing failure data in FTA and criticality
indices obtained using the BN model, the proposed integration offers a
probabilistic estimation of IoT system failure and a viable safety guide
for designing IoT systems.
| Identifer | oai:union.ndltd.org:BRADFORD/oai:bradscholars.brad.ac.uk:10454/19795 |
| Date | 18 January 2024 |
| Creators | Abdulhamid, Alhassan, Kabir, Sohag, Ghafir, Ibrahim, Lei, Ci |
| Source Sets | Bradford Scholars |
| Language | English |
| Detected Language | English |
| Type | Conference paper, No full-text in the repository |
| Rights | Unspecified |
| Relation | https://www.icadcml.in/index.html#proc |
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