Return to search

Characterisation of ferroelectric PZT thin films for FRAM application

No description available.
Identiferoai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:609070
Date January 2010
CreatorsZhu, Hui
PublisherUniversity of Cambridge
Source SetsEthos UK
Detected LanguageEnglish
TypeElectronic Thesis or Dissertation

Page generated in 0.0015 seconds