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Characterisation of ferroelectric PZT thin films for FRAM application

No description available.
Identiferoai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:609070
Date January 2010
CreatorsZhu, Hui
PublisherUniversity of Cambridge
Source SetsEthos UK
Detected LanguageEnglish
TypeElectronic Thesis or Dissertation

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