Recently, the high-power light-emitting diodes (LEDs) have been used from the traditional indicator purpose to general illumination purpose. The operating environment and requirement has been more severe. The long operating life high efficiency and high reliability are its main feature attracting the lighting community to this technology.
The effect of operating temperature on the degradations of high-power blue LEDs is studied in this thesis. The experiment, measurements, and finite element simulations were conducted to investigate the possible causes of LED degradation. The influence of LED material degeneration on the radiometric pattern was analyzed by tracing rays simulation.
Different groups of sample LEDs produced by Lumileds, Unity opto technology Co., and Everlight electronics Co. were studied. Different operating ambient temperatures, e.g. 80oC, 100 oC, and 120 oC, were considered in the accelerated aging test. Experimental results indicated that yellowing, carbonization, gel degeneration, lens chapping and deformation were observed during the test. Results also indicated that the operating temperature is the key factor for LED failure mechanism, that is, different operating ambient temperature may lead to different degradation phenomenon.
Numerical simulation results shown that the creep caused by high temperature and thermal stress would cause solder takeoff. This takeoff defects were observed in experimental results. Through ray tracing simulation, it is assured that gel degeneration would change the radiometric pattern of the LED significantly.
| Identifer | oai:union.ndltd.org:NSYSU/oai:NSYSU:etd-0907107-032945 |
| Date | 07 September 2007 |
| Creators | Lin, Yu-kuan |
| Contributors | Ying-Chien Tsai, Jaw-Hwa Kuang, Yuang-Chuan Chen, Der-Min Tsay |
| Publisher | NSYSU |
| Source Sets | NSYSU Electronic Thesis and Dissertation Archive |
| Language | English |
| Detected Language | English |
| Type | text |
| Format | application/pdf |
| Source | http://etd.lib.nsysu.edu.tw/ETD-db/ETD-search/view_etd?URN=etd-0907107-032945 |
| Rights | not_available, Copyright information available at source archive |
Page generated in 0.0015 seconds