In this work, based on both experimental and theoretical approach, the contact ESD behavior on a PCB circuit is investigated. The discharge mechanisms of ESD (Electrostatic Discharge) phenomena are discussed by both practical measurement and mathematic analysis. Simplified mathematic models include CR-R¡BCR-C and CR-L are proposed to explain the low frequency phenomena of ESD discharge events. Moreover, some experimental setups with good repeatability are demonstrated for measuring the ESD-induced noise on high-speed PCB and some countermeasures are suggested to reduce ESD damage.
| Identifer | oai:union.ndltd.org:NSYSU/oai:NSYSU:etd-0722103-165642 |
| Date | 22 July 2003 |
| Creators | Huang, Yi-Shang |
| Contributors | Chih-Wen Kuo, Jin-Ching Huang, Ken-Huang Lin, Tzyy-Sheng Horng, Tzong-Lin Wu |
| Publisher | NSYSU |
| Source Sets | NSYSU Electronic Thesis and Dissertation Archive |
| Language | Cholon |
| Detected Language | English |
| Type | text |
| Format | application/pdf |
| Source | http://etd.lib.nsysu.edu.tw/ETD-db/ETD-search/view_etd?URN=etd-0722103-165642 |
| Rights | withheld, Copyright information available at source archive |
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