Return to search

Endurance characterization and improvement of floating gate semiconductor memory devices

Thesis (M.S.)--Rutgers University, 2009. / "Graduate Program in Electrical and Computer Engineering." Includes bibliographical references (p. 113-116).

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/551425123
Date January 2009
CreatorsKhan, Faraz I.
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish

Page generated in 0.0015 seconds