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Technology and reliability of sub-micron 1T-Flash EEPROM /

Thesis (Ph. D.)--Lehigh University, 2000. / Includes vita. Includes bibliographical references (leaves 145-151).

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/47236068
Date January 2000
CreatorsNkansah, Franklin D.
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
TypeAcademic dissertations

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