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Relation between critical current density and flux flow resistivity in Bi2223 bulk element for fault current limiter

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Identiferoai:union.ndltd.org:NAGOYA/oai:ir.nul.nagoya-u.ac.jp:2237/6788
Date06 1900
CreatorsAritake, T., Noda, T., Shimizu, H., Yokomizu, Y., Matsumura, T., Murayama, N.
PublisherIEEE
Source SetsNagoya University
LanguageEnglish
Detected LanguageEnglish
TypeArticle(publisher)
RightsCopyright © 2003 IEEE. Reprinted from (relevant publication info). This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Nagoya University’s products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org.

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