Aplicações do método Warren-Averbach de análise de perfis de difração / Applications of the Warren-Averbach method of X-ray diffraction line profile analysis

Description

Made available in DSpace on 2014-10-09T12:42:15Z (GMT). No. of bitstreams: 0 / Made available in DSpace on 2014-10-09T14:05:30Z (GMT). No. of bitstreams: 0 / Dissertação (Mestrado) / IPEN/D / Instituto de Pesquisas Energeticas e Nucleares - IPEN-CNEN/SP

Links & Downloads

1. http://repositorio.ipen.br:8080/xmlui/handle/123456789/10585

Tags

CRYSTALLOGRAPHY

FOURIER ANALYSIS

CHEMICAL ANALYSIS

X-RAY DIFFRACTION

MICROSTRUCTURE

ZIRCALOY

YTRIUM OXIDES

ZINC OXIDES

COMPUTER CODES

Additional Fields

Identifer	oai:union.ndltd.org:IBICT/oai:10.40.40.102:123456789/10585
Date	09 October 2014
Creators	ICHIKAWA, RODRIGO U.
Contributors	Orientador: Luis Gallego Martinez
Source Sets	IBICT Brazilian ETDs
Detected Language	Portuguese
Type	info:eu-repo/semantics/publishedVersion, info:eu-repo/semantics/masterThesis
Format	94
Source	reponame:Repositório Institucional do IPEN, instname:Instituto de Pesquisas Energéticas e Nucleares, instacron:IPEN
Coverage	N
Rights	info:eu-repo/semantics/openAccess