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Charge carrier dynamics and defect generation at the Si/SiO2 interface proped by femtosecond optical second harmonic generation

University, Diss., 2005--Jena.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/179863564
CreatorsScheidt, Torsten.
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
TypeOnline-Publikation.

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