Charge carrier dynamics and defect generation at the Si/SiO2 interface proped by femtosecond optical second harmonic generation

Description

University, Diss., 2005--Jena.

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1. http://www.db-thueringen.de/dissOnline/FSU_Jena_Scheidt_Torsten
2. http://deposit.d-nb.de/cgi-bin/dokserv?idn=976450127
3. http://www.db-thueringen.de/servlets/DerivateServlet/Derivate-6641/Diss_Torsten_Scheidt.pdf

Tags

Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/179863564
Creators	Scheidt, Torsten.
Source Sets	OCLC
Language	English
Detected Language	English
Type	Online-Publikation.