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CHARACTERISATION OF X-RAY NANO-FOCUSING OPTICS WITH A GRATING INTERFEROMETER

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Identiferoai:union.ndltd.org:UPSALLA1/oai:DiVA.org:kth-143030
Date January 2014
CreatorsSanz, Claude
PublisherKTH, Tillämpad fysik
Source SetsDiVA Archive at Upsalla University
LanguageEnglish
Detected LanguageUnknown
TypeStudent thesis, info:eu-repo/semantics/bachelorThesis, text
Formatapplication/pdf
Rightsinfo:eu-repo/semantics/openAccess
RelationTRITA-FYS, 0280-316X ; 2014:09

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